单词 | atomic force microscope |
释义 | atomic force microscopeA microscope that uses a tiny probe mounted on a cantilever to scan the surface of an object. The probe is extremely close to-but does not touch-the surface. As the probe traverses the surface, attractive and repulsive forces arising between it and the atoms on the surface induce forces on the probe that bend the cantilever. The amount of bending is measured and recorded, providing a map of the atoms on the surface. Atomic force microscopes can achieve magnification of a factor of 5 X 106, with a resolution of 2 angstroms, sufficient to resolve individual carbon atoms. Also called scanning force microscope Words nearby atomic force microscopeatomic clock, atomic cocktail, atomic energy, Atomic Energy Authority, Atomic Energy Commission, atomic force microscope, atomic heat, atomic hydrogen, atomicity, atomic mass, atomic mass unit The American Heritage® Science Dictionary Copyright © 2011. Published by Houghton Mifflin Harcourt Publishing Company. All rights reserved. |
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