| 释义 |
scanning transmission electron microscope scanning transmission electron microscope[′skan·iŋ tranz′mish·ən i′lek‚trän ′mī·krə‚skōp] (electronics) A type of electron microscope which scans with an extremely narrow beam that is transmitted through the sample; the detection apparatus produces an image whose brightness depends on atomic number of the sample. Abbreviated STEM. |