| 单词 |
reflection x-ray microscopy |
| 释义 |
reflection x-ray microscopy reflection x-ray microscopy[ri′flek·shən ¦eks‚rā mi′kräs·kə·pē] (engineering) A technique for producing enlarged images in which a beam of x-rays is successively reflected at grazing incidence, from two crossed cylindrical surfaces; resolution is about 0.5-1 micrometer. |
| 随便看 |
- naum ilich idelson
- naum markovich antselovich
- naum neemia pevsner
- naumov, aleksei
- naumov, aleksei aleksandrovich
- naumov, boris
- naumov, boris nikolaevich
- naumov, mikhail
- naumov, mikhail ivanovich
- naumov, nikolai
- naumov, nikolai aleksandrovich
- naumov, nikolai ivanovich
- naumov, sergei
- naumov, sergei nikolaevich
- naumov, stepan
- naumov, stepan stepanovich
- naumov, vladimir
- naumov, vladimir naumovich
- naum pavlovich farberov
- naum pevsner
- naums
- naun
- naunt
- naunyc
- naunyn-minkowski method
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