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reflection x-ray microscopy
释义
reflection x-ray microscopy
reflection x-ray microscopy
[
ri′flek·shən ¦eks‚rā mi′kräs·kə·pē
]
(engineering)
A technique for producing enlarged images in which a beam of x-rays is successively reflected at grazing incidence, from two crossed cylindrical surfaces; resolution is about 0.5-1 micrometer.
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更新时间:2026/6/13 10:30:52