释义 |
near-field scanning optical microscopy
near-field scanning optical microscopy[¦nir ¦fēld ‚skan·iŋ ‚äp·tə·kəl mī′kräs·kə·pē] (optics) A technique for making optical measurements at dimensions much smaller than the wavelength of light, by scanning a nanometric detector or radiation source in proximity to a sample surface. Also known as scanning near-field optical microscopy. See NSOM See NSOM |