| 单词 |
inductive fault analysis |
| 释义 |
inductive fault analysis
inductive fault analysis[in‚dək·tiv ′fȯlt ə‚nal·ə·səs] (electronics) A method of analyzing the effects of defects on an integrated circuit, in which a computer simulates an electron that scatters at random faults in the form of additional or missing areas of material on the set of drawings of the masks from which the circuits are fabricated. AcronymsSeeIFA |
| 随便看 |
- shaffer classification
- shaffer, gordon
- shaffer-hartmann method
- shaffer, peter
- shaffer peter levin
- shaffer, sir peter
- shaffle
- shaffler
- shafi ahmed al-sheik, al-
- shafi'i, al-
- shafiite
- shafirov, petr
- shafirov, petr pavlovich
- shafonskii, afanasii
- shafonskii, afanasii filimonovich
- shafr
- shafran, daniil
- shafran, daniil borisovich
- shafranovo
- shafranovskii, ilarion
- shafranovskii, ilarion ilarionovich
- shafston international college
- shaft
- shaft alley
- shaft allowance
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