| 单词 | ballistic electron emission microscopy |
| 释义 | > as lemmasballistic electron emission microscopy ballistic electron emission microscopy n. Physics a technique in which a scanning tunnelling microscope tip is used to inject ballistic electrons into a sample consisting of at least two layers, in order to investigate the interface between the layers. ΚΠ 1988 Sci. Amer. July 11/1 Ballistic-electron-emission microscopy can map the Schottky, an energy threshold at the critical metal-semiconductor interface on microelectronic devices. 1997 Surface Rev. & Lett. 4 307/1 The invention of ballistic electron emission microscopy..has opened up new possibilities for extending the spatial resolution capabilities of scanning probe techniques to the study of buried interfaces. < as lemmas |
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