To add to the design challenge, device properties often vary between each processed semiconductor wafer.

The patent deals with fabrication of integrated circuits on a semiconductor wafer.

A typical test of a semiconductor wafer would entail the acquisition of spectra from many points on a patterned or unpatterned wafer.

Some areas where scattering and scattering theory are significant include radar sensing, medical ultrasound, semiconductor wafer inspection, polymerization process monitoring, acoustic tiling, free-space communications and computer-generated imagery.

Impurity ions may move from the cold side of a semiconductor wafer towards the hot side, since the higher temperature makes the transition structure required for atomic jumps more achievable.