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单词 atomic force microscope
释义
atomic force microscope
n.
A microscope, capable of a magnification factor of 5 × 106 and a resolution of 2 angstroms, that provides a map of the atoms on the surface of an object by measuring the attractive and repulsive forces arising between a tiny probe drawn along the surface and the atoms on that surface. Also called scanning force microscope.
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更新时间:2024/9/21 11:13:23