| 释义 |
Binet-Simon|biːneɪsiːˈmɔ̃|
The names of the French psychologists A. Binet (1857–1911) and T. Simon (1873–1961), applied attrib. to a form of intelligence test which they devised. Binet–Simon scale, the measurement of intelligence by such a test. Also Binet('s) scale, Binet test. Also ellipt.
1910G. M. Whipple Man. Mental & Physical Tests 278 There are marked differences in the amount of work (number of additions) done..e.g., in Binet's tests, from 40 to 96 numbers. Ibid. 491 (heading) Application of the 1905 Binet-Simon Tests to Defectives. 1912Jrnl. Educ. Psychol. III. 70 The following chart..throws into relief the periods of rapid, normal and slow mental growth as measured by the Binet scale. Ibid. 63 The Binet tests of 1908 are the only set hitherto devised covering any considerable variety of functions. 1914M. Drummond in W. B. Drummond tr. Binet & Simon's Mentally Defective Children 147 Part of the interest of this work on defective children consists in the fact that in it we find the origin of those ideas and investigations which culminated in the formation of the Binet–Simon Scale of Intelligence, now so widely known throughout Europe and America. 1921C. L. Burt Mental & Scholastic Tests 3 The Binet–Simon scale consists of about sixty graded tests for measuring the intelligence of school children. 1963M. McCarthy Group iv. 87 She wished he would let her give him the Binet and some of the personality tests she had tried on the group at Vassar. |